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Applied scanning probe methods

  1. Title statementApplied scanning probe methods. III, Characterization / Bharat Bhushan, Harald Fuchs (Eds.)
    Issue dataHeidelberg ; Berlin ; New York : Springer Verlag, c2006
    Phys.des.xliii, 378 s : il.
    ISBN14344904 (ISSN)
    Edition Nanoscience and technology
    NoteLit. v textu. Rejstř.
    Another responsib. Bhushan, Bharat, 1949- (editor)
    Fuchs, Harald, 1951- (editor)
    Subj. Headings skenovací mikroskopie scanning probe microscopy * nanomateriály nanostructure materials * nanotechnologie nanotechnology
    Conspect620.1/.2 - Nauka o materiálu
    UDC 53.086:004.352 , 62-022.532 , 620.1 , 620.2-022.532 , 621.3.049.76
    CountryNěmecko ; Spojené státy americké
    Languageangličtina
    Document kindBooks
    Call numberBarcodeLocationSublocationInfo
    F/897-3 (PřF)3134022823PřFPřF, KEF - Mgr. VůjtekIn-Library Use Only