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Applied scanning probe methods
- Applied
Applied scanning probe methods. IX, Characterization / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori. -- Berlin ; Heidelberg : Springer , c2008. -- Berlin ; Heidelberg : Springer, 2008c. -- lix, 387 s. : il. -- (Nanoscience and technology). -- ISBN : 9783540740827.
Bhushan, Bharat, 1949-. Fuchs, Harald, 1951-. Tomitori, M. (Masahiko)
skenovací mikroskopie. nanomateriály. nanotechnologie. průmysl
53.086:004.352. 62-022.532. 338.45:620.2-022.532. 620.2-022.532
Number of the records: 1