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Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching

  1. Kaupp, G
    Atomic force microscopy, scanning nearfield optical microscopy and nanoscratching : application to rough and natural surfaces / G. Kaupp. -- Berlin : Springer, c2006. -- xii, 292 s. : il. -- (Nanoscience and technology). -- Pod názvem: With 239 figures and 7 tables. -- ISBN : 3-540-28405-2 (váz.) ISBN (invalid) 978-3-540-28405-5.
    biochemie. lékařství. lékařská biochemie. mikroskopie atomárních sil. monografie
    61:577.1. [53.086:004.352]:539.186. (048.8)

Number of the records: 1  

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