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Multiple-beam interferometry of surfaces and films
Title statement Multiple-beam interferometry of surfaces and films / by S. Tolansky Personal name Tolansky, S. (author) Edition statement [1th ed.] Issue data Shanghai : Huxi Shudian, 1948 Phys.des. 187 s. : il. Edition Monographs on the physics and chemistry of materials Note Lit. Rejstř. Subj. Headings interferometrie interferometry * interferometrie interferometry * záření radiation MeSH interferometrie Interferometry Conspect 535 - Optika UDC 543.453 , 535.4 Country Čína Language angličtina Document kind Books 
book
Call number Barcode Location Sublocation Info 56/35 (LF) 3135021245 LF LF Lékařská biofyzika, biometrie a informatika In-Library Use Only
Number of the records: 1