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Speckle metrology

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    Title statementSpeckle metrology / edited by Rajpal S. Sirohi
    Issue dataNew York : Marcel Dekker, c1993
    Phys.des.xiii, 551 s. : il.
    ISBN0824789326
    Edition Optical engineering; 38
    NoteObsahuje literaturu v textu
    Rejstřík
    Another responsib. Sirohi, R. S., 1943- (editor)
    Subj. Headings technika technology * metrologie metrology * optika optics
    Conspect53 - Fyzika
    UDC 531.715:620.1
    CountrySpojené státy americké
    Languageangličtina
    Document kindBooks
    View book information on page www.obalkyknih.cz

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    Call numberBarcodeLocationSublocationInfo
    N/A3134018273PřFPřF, Výzkumné centrum pro optikuIn-Library Use Only

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