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Scanning probe microscopy
Title statement Scanning probe microscopy : atomic scale engineering by forces and currents / A. Foster, W. Hofer Personal name Foster, Adam (author) Issue data New York : Springer, c2006 Phys.des. xiv, 281 s. : il. ISBN 0387400907 Edition Nanoscience and technology Note Pod názvem: With 116 Figures Internal Bibliographies/Indexes Note Obsahuje bibliografie a rejstřík Another responsib. Hofer, Werner (author) Subj. Headings fyzika tenkých vrstev physics of thin layers * skenovací mikroskopie scanning probe microscopy * nanotechnologie nanotechnology * atomová spektroskopie atomic spectroscopy * molekulární spektroskopie molecular spectroscopy Conspect 53 - Fyzika UDC 53.086:004.352 , 57.086.2/.3 , 62-022.532 , 539.211 Country Spojené státy americké Language angličtina Document kind Books 
book
Call number Barcode Location Sublocation Info N/A 3134023286 PřF PřF, KEF - Mgr. Vůjtek In-Library Use Only
Number of the records: 1