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Applied scanning probe methods

  1. Title statementApplied scanning probe methods. IX, Characterization / Bharat Bhushan, Harald Fuchs, Masahiko Tomitori
    Issue dataBerlin ; Heidelberg : Springer, 2008c
    Phys.des.lix, 387 s. : il.
    ISBN9783540740827
    Edition Nanoscience and technology
    Internal Bibliographies/Indexes NoteObsahuje bibliografické odkazy a rejstřík
    Another responsib. Bhushan, Bharat, 1949- (editor)
    Fuchs, Harald, 1951- (editor)
    Tomitori, M. (Masahiko) (editor)
    Subj. Headings skenovací mikroskopie scanning probe microscopy * nanomateriály nanomaterials * nanotechnologie nanotechnology * průmysl industries
    Conspect620.1/.2 - Nauka o materiálu
    UDC 53.086:004.352 , 62-022.532 , 338.45:620.2-022.532 , 620.2-022.532
    CountryNěmecko
    Languageangličtina
    Document kindBooks
    View book information on page www.obalkyknih.cz

    book

    Call numberBarcodeLocationSublocationInfo
    PK/KEF/Vůjtek (PřF-KBO)3134023347PřFPřF, KEF - Mgr. VůjtekIn-Library Use Only

Number of the records: 1  

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