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Confocal microscopy

  1. Title statementConfocal microscopy / Jian Liu and Jiubin Tan. [elektronický zdroj]
    PublicationSan Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Morgan & Claypool Publishers, [2016]
    DistributionBristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2016]
    Phys.des.1 electronic document (various pagings) : illustrations (some color).
    ISBN9781681743394 mobi
    9781681743370 (online)
    Edition[IOP release 3]
    IOP concise physics, ISSN 2053-2571
    Note"A Morgan & Claypool publication as part of IOP Concise Physics"--Title page verso.
    "Version: 20161201"--Title page verso.
    Internal Bibliographies/Indexes NoteIncludes bibliographical references.
    ContentsPreface -- 1. Confocal microscopy and its application in China -- 1.1. A brief review of confocal microscopy -- 1.2. Resolution -- 1.3. Standardization in China
    Content note8. Medium aided scattering measurement -- 8.1. Introduction -- 8.2. The principle of medium aided scattering confocal microscopy -- 8.3. Analysis of deposition uniformity of a fluorescent medium layer -- 8.4. Error analysis and height correction of the medium layer -- 8.5. Application of medium aided scattering confocal microscopy. 7. Differential confocal microscopy -- 7.1. Introduction -- 7.2. Application of DCM in China -- 7.3. The Basic principle of DDCM. 6. Confocal axial peak extraction algorithm -- 6.1. Introduction -- 6.2. Centroid method for localization of confocal peak -- 6.3. Nonlinear fitting method for peak localization -- 6.4. Deviation analysis for localization of confocal axial peak. 5. Pupil filter design -- 5.1. Phase rotation transformation -- 5.2. The design method of filters with global minimizing side lobes. 4. Decoupling criteria for three-dimensional optical microscopic measurement -- 4.1. Introduction -- 4.2. Decoupling model for the measurement of thin samples -- 4.3. Decoupling model for the measurement of a deep groove sample -- 4.4. Experiments. 3. Incoherent three-dimensional optical transfer function -- 3.1. Development of 3D optical transfer function -- 3.2. 3D imaging models of CM -- 3.3. 3D-OTF of CM -- 3.4. 3D-OTF of differential. 2. Point spread function model -- 2.1. Lens imaging -- 2.2. PSF in confocal imaging. 10. Confocal profilometer -- 10.1. Introduction -- 10.2. Basic principle -- 10.3. The extraction method of discrete surface -- 10.4. Application of confocal profilometer.. 9. Scanning technology -- 9.1. Introduction -- 9.2. Scanners -- 9.3. Raster scanning -- 9.4. [alpha]-[beta] circular scanning
    Notes to AvailabilityPřístup pouze pro oprávněné uživatele
    NotePožadavky na systém: Adobe Acrobat Reader, EPUB reader. or Kindle reader.. Způsob přístupu: World Wide Web.
    Another responsib. Tan, J. (Jiubin),
    Another responsib. Morgan & Claypool Publishers,
    Institute of Physics (Great Britain),
    Subj. Headings SCIENCE / Physics / Optics & Light. * SCIENCE / Scientific Instruments. * SCIENCE / Microscopes & Microscopy. * Laser Physics. * Microscopy. * Confocal microscopy.
    Form, Genre elektronické knihy electronic books
    CountryKalifornie
    Languageangličtina
    Document kindElectronic books
    URLPlný text pro studenty a zaměstnance UPOL
    book

    book


    The confocal microscope is appropriate for imaging cells or the measurement of industrial artefacts. However, junior researchers and instrument users sometimes misuse imaging concepts and metrological characteristics, such as position resolution in industrial metrology and scale resolution in bio-imaging. And, metrological characteristics or influence factors in 3D measurement such as height assessment error caused by 3D coupling effect are so far not yet identified. In this book, the authors outline their practices by the working experiences on standardization and system design. This book assumes little previous knowledge of optics, but rich experience in engineering of industrial measurements, in particular with profile metrology or areal surface topography will be very helpful to understand the theoretical concerns and value of the technological advances. It should be useful for graduate students or researchers as extended reading material, as well as microscope users alongside their handbook.

    8. Medium aided scattering measurement -- 8.1. Introduction -- 8.2. The principle of medium aided scattering confocal microscopy -- 8.3. Analysis of deposition uniformity of a fluorescent medium layer -- 8.4. Error analysis and height correction of the medium layer -- 8.5. Application of medium aided scattering confocal microscopy7. Differential confocal microscopy -- 7.1. Introduction -- 7.2. Application of DCM in China -- 7.3. The Basic principle of DDCM6. Confocal axial peak extraction algorithm -- 6.1. Introduction -- 6.2. Centroid method for localization of confocal peak -- 6.3. Nonlinear fitting method for peak localization -- 6.4. Deviation analysis for localization of confocal axial peak5. Pupil filter design -- 5.1. Phase rotation transformation -- 5.2. The design method of filters with global minimizing side lobes4. Decoupling criteria for three-dimensional optical microscopic measurement -- 4.1. Introduction -- 4.2. Decoupling model for the measurement of thin samples -- 4.3. Decoupling model for the measurement of a deep groove sample -- 4.4. Experiments3. Incoherent three-dimensional optical transfer function -- 3.1. Development of 3D optical transfer function -- 3.2. 3D imaging models of CM -- 3.3. 3D-OTF of CM -- 3.4. 3D-OTF of differential2. Point spread function model -- 2.1. Lens imaging -- 2.2. PSF in confocal imagingPreface -- 1. Confocal microscopy and its application in China -- 1.1. A brief review of confocal microscopy -- 1.2. Resolution -- 1.3. Standardization in China10. Confocal profilometer -- 10.1. Introduction -- 10.2. Basic principle -- 10.3. The extraction method of discrete surface -- 10.4. Application of confocal profilometer.9. Scanning technology -- 9.1. Introduction -- 9.2. Scanners -- 9.3. Raster scanning -- 9.4. [alpha]-[beta] circular scanning

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