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Kelvin probe force microscopy
Title statement Kelvin probe force microscopy : measuring and compensating electrostatic roces / Sascha Sadewasser, Thilo Glatzel, editors Publication Berlin ; Heidelberg : Springer, [2012] Copyright notice date ©2012 Phys.des. xiv, 331 stran : ilustrace, grafy, schémata ISBN 978-3-642-22565-9 (vázáno) Edition Springer series in surface sciences ISSN 0931-5195 ; 48 Note Pod názvem: With 189 figures Internal Bibliographies/Indexes Note Obsahuje bibliografie a rejstřík Another responsib. Sadewasser, Sascha (editor) Glatzel, Thilo, 1972- (editor) Subj. Headings mikroskopie atomárních sil atomic force microscopy * povrchy surfaces * nauka o materiálu materials science Form, Genre sborníky miscellanea Conspect 53 - Fyzika UDC [53.086:004.352]:539.186 , 620.2 , 538.971 , 544.7 , (082) Country Německo Language angličtina Document kind Books 
book
Call number Barcode Location Sublocation Info F/1258 (PřF) 3134045899 PřF PřF, KFC - doc. Ing. Pavel JELÍNEK Ph.D. In-Library Use Only
Number of the records: 1