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mikroskopie skenující sondou

  1. Topical termmikroskopie skenující sondou
    See linkmikroskopie rastrovací sondou (UF)
    Scanning Probe Microscopy (UF)
    See alsomikroskopie
    mikroskopie atomárních sil
    rastrovací tunelová mikroskopie
    skenovací elektrochemická mikroskopie
    Linking entryMicroscopy, Scanning Probe
    ConspectE01. - 370. - 350. - 515. - 666
    E05. - 595. - 666
    NoteScanning microscopy in which a very sharp probe is employed in close proximity to a surface, exploiting a particular surface-related property. When this property is local topography, the method is atomic force microscopy (MICROSCOPY, ATOMIC FORCE), and when it is local conductivity, the method is scanning tunneling microscopy (MICROSCOPY, SCANNING TUNNELING).
    DatabaseMESH
    References (4) - MESH
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Number of the records: 1  

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