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1.Kelvin probe force microscopy
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Kelvin probe force microscopy : measuring and compensating electrostatic roces / Sascha Sadewasser, Thilo Glatzel, editors. Berlin ; Heidelberg : Springer, [2012] ©2012 . xiv, 331 stran

Lok/dislok Absenčně Vypůjčené Rezervované Prezenčně Nedostupné Pouze k rezervaci

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