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  1. An introduction to time-of-flight secondary ion mass spectrometry (ToF-SIMS) and its application to materials science / Sarah Fearn. [elektronický zdroj].    San Rafael [California] (40 Oak Drive, San Rafael, CA, 94903, USA) : Morgan & Claypool Publishers, [2015]  Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2015] . 1 online resource (various pagings)
    Plný text pro studenty a zaměstnance UPOL
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