Conductive
Conductive atomic force microscopy : applications in nanomaterials / edited by Mario Lanza. -- Weinheim : Wiley-VCH, 2017. -- 1 online resource (250 pages). -- Obsahuje: History and Status of the CAFM / Chengbin Pan, Yuanyuan Shi, Fei Hui, Enric Grustan-Gutierrez, Mario Lanza -- Fabrication and Reliability of Conductive AFM Probes / Oliver Krause -- Fundamentals of CAFM Operation Modes / Guenther Benstetter, Alexander Hofer, Donping Liu, Werner Frammelsberger, Mario Lanza -- Investigation of High-k Dielectric Stacks by C-AFM: Advantages, Limitations, and Possible Applications / Mathias Rommel, Albena Paskaleva -- Characterization of Grain Boundaries in Polycrystalline HfO2 Dielectrics / Shubhakar Kalya, Sean Joseph O'Shea, Kin Leong Pey -- CAFM Studies on Individual GeSi Quantum Dots and Quantum Rings / Rong Wu, Shengli Zhang, Yi Lv, Fei Xue, Yifei Zhang, Xinju Yang -- Conductive Atomic Force Microscopy of Two-Dimensional Electron Systems: From AlGaN/GaN Heterostructures to Graphene and MoS2 / Filippo Giannazzo, Gabriele Fisichella, Giuseppe Greco, Patrick Fiorenza, Fabrizio Roccaforte -- Nanoscale Three-Dimensional Characterization with Scalpel SPM / Umberto Celano, Wilfried Vandervorst -- Conductive Atomic Force Microscopy for Nanolithography Based on Local Anodic Oxidation / Matteo Lorenzoni, Francesc P?rez-Murano -- Combination of Semiconductor Parameter Analyzer and Conductive Atomic Force Microscope for Advanced Nanoelectronic Characterization / Vanessa Iglesias, Xu Jing, Mario Lanza -- Design and Fabrication of a Logarithmic Amplifier for Scanning Probe Microscopes to Allow Wide-Range Current Measurements / Lidia Aguilera, Joan Grifoll-Soriano -- Enhanced Current Dynamic Range Using ResiScope" and Soft-ResiScope" AFM Modes / Louis Pacheco, Nicolas F Martinez -- Multiprobe Electrical Measurements without Optical Interference / David Lewis, Andrey Ignatov, Sasha Krol, Rimma Dekhter, Alina Strinkovsky -- KPFM and its Use to Characterize the CPD in Different Materials / Yijun Xia, Bo Song -- Hot Electron Nanoscopy and Spectroscopy (HENs) / Andrea Giugni, Bruno Torre, Marco Allione, Gerardo Perozziello, Patrizio Candeloro, Enzo Di Fabrizio. -- ISBN : 9783527699773 (online ; oBook). -- 3527699775 (online ; oBook). -- 3527699783 (online). -- 9783527699780 (online). -- 3527699805. -- 3527699775. -- 3527340912. -- 3527699791.
Lanza, Mario
Atomic force microscopy. Atomic force microscopy. elektronické knihy